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Accelerated testing : statistical models, test plans and data analyses /

By: Nelson, Wayne, 1936-.
Series: Wiley series in probability and mathematical statisticsApplied probability and statistics.Publisher: New York : Wiley, c1990Description: xiv, 601 p. : ill. ; 25 cm.Content type: text Media type: unmediated Carrier type: volumeISBN: 0471522775; 9780471522775 :.Subject(s): Failure time data analysis | Reliability (Engineering) -- Statistical methods | Accelerated life testing -- Statistical methods | Engineering Mathematical modelsDDC classification: 519.5 Summary: Accelerated testing is a process by which products can be life tested at high stress conditions to yield failures quickly. This study provides modern statistical methods for accelerated testing, plus accelerated test models, data analyses and test plans.
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Item type Current library Call number Copy number Status Date due Barcode Item holds
Standard Loan Standard Loan ATU Sligo Yeats Library Withdrawn 519.5 (Browse shelf(Opens below)) 1 Available 0030761
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"A Wiley-Interscience publication."

Includes bibliographical references (p. 561-577).

Accelerated testing is a process by which products can be life tested at high stress conditions to yield failures quickly. This study provides modern statistical methods for accelerated testing, plus accelerated test models, data analyses and test plans.

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