Accelerated testing : statistical models, test plans and data analyses /
By: Nelson, Wayne
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Series: Wiley series in probability and mathematical statisticsApplied probability and statistics.Publisher: New York : Wiley, c1990Description: xiv, 601 p. : ill. ; 25 cm.Content type: text Media type: unmediated Carrier type: volumeISBN: 0471522775; 9780471522775 :.Subject(s): Failure time data analysis![](/opac-tmpl/bootstrap/images/filefind.png)
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Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
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ATU Sligo Yeats Library Withdrawn | 519.5 (Browse shelf(Opens below)) | 1 | Available | 0030761 |
"A Wiley-Interscience publication."
Includes bibliographical references (p. 561-577).
Accelerated testing is a process by which products can be life tested at high stress conditions to yield failures quickly. This study provides modern statistical methods for accelerated testing, plus accelerated test models, data analyses and test plans.