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Design and analysis of accelerated tests for mission critical reliability /
By: LuValle, Michael J
.
Contributor(s): Lefevre, Bruce G | Kannan, SriRaman.
Publisher: Boca Raton : Chapman & Hall/CRC, 2004Description: 236 p. : ill. ; 24 cm.Content type: text Media type: unmediated Carrier type: volumeISBN: 1584884711 (alk. paper); 9781584884712.Subject(s): Accelerated life testing | Reliability (Engineering)DDC classification: 620.00452
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Standard Loan
|
ATU Sligo Yeats Library Main Lending Collection | 620.00452 LUV (Browse shelf(Opens below)) | 1 | Available | 0058293 |
Total holds: 0
Includes bibliographical references (p. 227-229) and index.